Norman F. Schneidewind, Mike Hinchey. A consumer/producer approach to risk-driven software reliability and testing. In Sung Y. Shin, Sascha Ossowski, editors, Proceedings of the 2009 ACM Symposium on Applied Computing (SAC), Honolulu, Hawaii, USA, March 9-12, 2009. pages 537-538, ACM, 2009. [doi]
Abstract is missing.