Can Metrics and Models be Applied Across Multiple Releases or Projects?

Norman F. Schneidewind, Wendell D. Jones, Taghi M. Khoshgoftaar, Paul W. Oman, George E. Stark. Can Metrics and Models be Applied Across Multiple Releases or Projects?. In 6th IEEE International Software Metrics Symposium (METRICS 1999), 4-6 November 1999, Boca Raton, FL, USA. pages 324, IEEE Computer Society, 1999. [doi]

Abstract

Abstract is missing.