Panel: Issues in the next generation of dependability standards

Norman F. Schneidewind, Jean-Claude Laprie, Allen P. Nikora, Michael R. Lyu, John D. Musa, Bill Everett. Panel: Issues in the next generation of dependability standards. In Ninth International Symposium on Software Reliability Engineering, ISSRE 1998, Paderborn, Germany, November 4-7, 1998. pages 101-104, IEEE Computer Society, 1998. [doi]

Authors

Norman F. Schneidewind

This author has not been identified. Look up 'Norman F. Schneidewind' in Google

Jean-Claude Laprie

This author has not been identified. Look up 'Jean-Claude Laprie' in Google

Allen P. Nikora

This author has not been identified. Look up 'Allen P. Nikora' in Google

Michael R. Lyu

This author has not been identified. Look up 'Michael R. Lyu' in Google

John D. Musa

This author has not been identified. Look up 'John D. Musa' in Google

Bill Everett

This author has not been identified. Look up 'Bill Everett' in Google