Panel: Issues in the next generation of dependability standards

Norman F. Schneidewind, Jean-Claude Laprie, Allen P. Nikora, Michael R. Lyu, John D. Musa, Bill Everett. Panel: Issues in the next generation of dependability standards. In Ninth International Symposium on Software Reliability Engineering, ISSRE 1998, Paderborn, Germany, November 4-7, 1998. pages 101-104, IEEE Computer Society, 1998. [doi]

@inproceedings{SchneidewindLNL98,
  title = {Panel: Issues in the next generation of dependability standards},
  author = {Norman F. Schneidewind and Jean-Claude Laprie and Allen P. Nikora and Michael R. Lyu and John D. Musa and Bill Everett},
  year = {1998},
  doi = {10.1109/ISSRE.1998.730854},
  url = {http://dx.doi.org/10.1109/ISSRE.1998.730854},
  researchr = {https://researchr.org/publication/SchneidewindLNL98},
  cites = {0},
  citedby = {0},
  pages = {101-104},
  booktitle = {Ninth International Symposium on Software Reliability Engineering, ISSRE 1998, Paderborn, Germany, November 4-7, 1998},
  publisher = {IEEE Computer Society},
  isbn = {0-8186-8991-9},
}