Norman F. Schneidewind, Mark Montrose, Alec Feinberg, Arbi Ghazarian, Jim McLinn, Christian Hansen, Phillip A. Laplante, Nihal Sinnadurai, Enrico Zio, Richard C. Linger, W. Eric Wong, Shiuh-Pyng Shieh, Joseph Childs. IEEE Reliability Society Technical Operations Annual Technical Report for 2010. IEEE Transactions on Reliability, 59(3):449-482, 2010. [doi]
Abstract is missing.