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Impact of the switching mode on the read noise of ReRAM devices

Kristoffer Schnieders, Stephan Aussen, Felix Cüppers, Susanne Hoffmann-Eifert, Stefan Wiefels. Impact of the switching mode on the read noise of ReRAM devices. In Ronald Tetzlaff, Fernando Corinto, Neil Kemp, Alon Ascoli, Andreas Mögel, Meng-Fan Marvin Chang, Joseph S. Friedman, Siting Liu 0001, John Paul Strachan, Stephan Menzel, Mehdi B. Tahoori, Martin Ziegler 0006, Jason Eshraghian, Ioannis Messaris, Christian Koitzsch, Thomas Mikolajick, Vasileios G. Ntinas, editors, Proceedings of the 18th ACM International Symposium on Nanoscale Architectures, NANOARCH 2023, Dresden, Germany, December 18-20, 2023. ACM, 2023. [doi]

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Kristoffer Schnieders

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Stephan Aussen

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Felix Cüppers

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Susanne Hoffmann-Eifert

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Stefan Wiefels

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