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Feature Diagrams: A Survey and a Formal Semantics

Pierre Yves Schobbens, Patrick Heymans, Jean-Christophe Trigaux. Feature Diagrams: A Survey and a Formal Semantics. In 14th IEEE International Conference on Requirements Engineering (RE 2006), 11-15 September 2006, Minneapolis/St.Paul, Minnesota, USA. pages 136-145, IEEE Computer Society, 2006. [doi]

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Pierre-Yves Schobbens

Identified as Pierre Yves Schobbens

Patrick Heymans

Identified as Patrick Heymans
(FUNDP
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Jean-Christophe Trigaux

This author has not been identified. Look up 'Jean-Christophe Trigaux' in Google
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