Pierre Yves Schobbens, Patrick Heymans, Jean-Christophe Trigaux. Feature Diagrams: A Survey and a Formal Semantics. In 14th IEEE International Conference on Requirements Engineering (RE 2006), 11-15 September 2006, Minneapolis/St.Paul, Minnesota, USA. pages 136-145, IEEE Computer Society, 2006. [doi]
Abstract is missing.