Challenging the High Performance - High Cost Paradigm in Test - researchr publication authors

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Ulrich Schoettmer, Toshiyuki Minami. Challenging the High Performance - High Cost Paradigm in Test. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 870-879, IEEE Computer Society, 1995.

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