Mario Schölzel. HW/SW co-detection of transient and permanent faults with fast recovery in statically scheduled data paths. In Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010. pages 723-728, IEEE, 2010. [doi]
@inproceedings{Scholzel10,
title = {HW/SW co-detection of transient and permanent faults with fast recovery in statically scheduled data paths},
author = {Mario Schölzel},
year = {2010},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5456957},
researchr = {https://researchr.org/publication/Scholzel10},
cites = {0},
citedby = {0},
pages = {723-728},
booktitle = {Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010},
publisher = {IEEE},
}