Lea Schreckenberg, René Otten, Patrick Vliex, Ran Xue, Jhih-Sian Tu, Inga Seidler, Stefan Trellenkamp, Lars R. Schreiber, Hendrik Bluhm, Stefan van Waasen. SiGe Qubit Biasing with a Cryogenic CMOS DAC at mK Temperature. In 49th IEEE European Solid State Circuits Conference, ESSCIRC 2023, Lisbon, Portugal, September 11-14, 2023. pages 161-164, IEEE, 2023. [doi]
@inproceedings{SchreckenbergOVXTSTSBW23,
title = {SiGe Qubit Biasing with a Cryogenic CMOS DAC at mK Temperature},
author = {Lea Schreckenberg and René Otten and Patrick Vliex and Ran Xue and Jhih-Sian Tu and Inga Seidler and Stefan Trellenkamp and Lars R. Schreiber and Hendrik Bluhm and Stefan van Waasen},
year = {2023},
doi = {10.1109/ESSCIRC59616.2023.10268801},
url = {https://doi.org/10.1109/ESSCIRC59616.2023.10268801},
researchr = {https://researchr.org/publication/SchreckenbergOVXTSTSBW23},
cites = {0},
citedby = {0},
pages = {161-164},
booktitle = {49th IEEE European Solid State Circuits Conference, ESSCIRC 2023, Lisbon, Portugal, September 11-14, 2023},
publisher = {IEEE},
isbn = {979-8-3503-0420-6},
}