A Factory Health Monitor: System identification, process monitoring, and control

Kyle Schroeder, James R. Moyne, Dawn M. Tilbury. A Factory Health Monitor: System identification, process monitoring, and control. In 2008 IEEE International Conference on Automation Science and Engineering, IEEE CASE 2008, Washington, DC, USA, August 23-26, 2008. pages 16-22, IEEE, 2008. [doi]

Authors

Kyle Schroeder

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James R. Moyne

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Dawn M. Tilbury

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