Kyle Schroeder, James R. Moyne, Dawn M. Tilbury. A Factory Health Monitor: System identification, process monitoring, and control. In 2008 IEEE International Conference on Automation Science and Engineering, IEEE CASE 2008, Washington, DC, USA, August 23-26, 2008. pages 16-22, IEEE, 2008. [doi]
@inproceedings{SchroederMT08,
title = {A Factory Health Monitor: System identification, process monitoring, and control},
author = {Kyle Schroeder and James R. Moyne and Dawn M. Tilbury},
year = {2008},
doi = {10.1109/COASE.2008.4626536},
url = {http://dx.doi.org/10.1109/COASE.2008.4626536},
researchr = {https://researchr.org/publication/SchroederMT08},
cites = {0},
citedby = {0},
pages = {16-22},
booktitle = {2008 IEEE International Conference on Automation Science and Engineering, IEEE CASE 2008, Washington, DC, USA, August 23-26, 2008},
publisher = {IEEE},
isbn = {978-1-4244-2022-3},
}