A. Schubert, Walter Anheier. On random pattern testability of cryptographic VLSI cores. In 4th European Test Workshop, ETW 1999, Constance, Germany, May 25-28, 1999. pages 15-20, IEEE Computer Society, 1999. [doi]
@inproceedings{SchubertA99,
title = {On random pattern testability of cryptographic VLSI cores},
author = {A. Schubert and Walter Anheier},
year = {1999},
doi = {10.1109/ETW.1999.803820},
url = {https://doi.org/10.1109/ETW.1999.803820},
researchr = {https://researchr.org/publication/SchubertA99},
cites = {0},
citedby = {0},
pages = {15-20},
booktitle = {4th European Test Workshop, ETW 1999, Constance, Germany, May 25-28, 1999},
publisher = {IEEE Computer Society},
isbn = {0-7695-0390-X},
}