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A. Schubert, Walter Anheier. On random pattern testability of cryptographic VLSI cores. In 4th European Test Workshop, ETW 1999, Constance, Germany, May 25-28, 1999. pages 15-20, IEEE Computer Society, 1999. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: On Random Pattern Testability of Cryptographic VLSI CoresA. Schubert, Walter Anheier. et, 16(3):185-192, 2000. [doi]
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