Rescue: A Microarchitecture for Testability and Defect Tolerance

Ethan Schuchman, T. N. Vijaykumar. Rescue: A Microarchitecture for Testability and Defect Tolerance. In 32st International Symposium on Computer Architecture (ISCA 2005), 4-8 June 2005, Madison, Wisconsin, USA. pages 160-171, IEEE Computer Society, 2005. [doi]

Authors

Ethan Schuchman

This author has not been identified. Look up 'Ethan Schuchman' in Google

T. N. Vijaykumar

This author has not been identified. Look up 'T. N. Vijaykumar' in Google