Erik Schüler, Daniel Scain Farenzena, Luigi Carro. Evaluating Sigma-Delta Modulated Signals to Develop Fault-Tolerant Circuits. In 11th European Test Symposium (ETS 2006), 21-24 May 2006, Southhampton, UK. pages 137-144, IEEE Computer Society, 2006. [doi]
Abstract is missing.