Donald M. Schuler, Ernst G. Ulrich, Thomas E. Baker, Susan P. Bryant. Random test generation using concurrent logic simulation. In Robert B. Hitchcock Sr., Donald J. Humcke, Stephen A. Szygenda, editors, Proceedings of the 12th Design Automation Conference, DAC '75, Boston, Massachusetts, USA, June 23-25, 1975. pages 261-267, ACM, 1975. [doi]
Abstract is missing.