On the existence of complete invariant feature spaces in pattern recognition

Hanns Schulz-Mirbach. On the existence of complete invariant feature spaces in pattern recognition. In 11th IAPR International Conference on Pattern Recognition, ICPR 1992. Conference B: Pattern Recognition Methodology and Systems, The Hague, Netherlands, August 30-September 3, 1992. pages 178-182, IEEE, 1992. [doi]

Abstract

Abstract is missing.