High-quality scanning using time-of-flight depth superresolution - researchr publication authors

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Sebastian Schuon, Christian Theobalt, James Davis, Sebastian Thrun. High-quality scanning using time-of-flight depth superresolution. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2008, Anchorage, AK, USA, 23-28 June, 2008. pages 1-7, IEEE, 2008. [doi]

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