Sebastian Schuon, Christian Theobalt, James Davis, Sebastian Thrun. High-quality scanning using time-of-flight depth superresolution. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2008, Anchorage, AK, USA, 23-28 June, 2008. pages 1-7, IEEE, 2008. [doi]
@inproceedings{SchuonTDT08,
title = {High-quality scanning using time-of-flight depth superresolution},
author = {Sebastian Schuon and Christian Theobalt and James Davis and Sebastian Thrun},
year = {2008},
doi = {10.1109/CVPRW.2008.4563171},
url = {http://doi.ieeecomputersociety.org/10.1109/CVPRW.2008.4563171},
researchr = {https://researchr.org/publication/SchuonTDT08},
cites = {0},
citedby = {0},
pages = {1-7},
booktitle = {IEEE Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2008, Anchorage, AK, USA, 23-28 June, 2008},
publisher = {IEEE},
isbn = {978-1-4244-2340-8},
}