Thomas Schweinböck, S. Schömann, D. Álvarez, Marco Buzzo, Werner Frammelsberger, Peter Breitschopf, Günther Benstetter. New trends in the application of Scanning Probe Techniques in Failure Analysis. Microelectronics Reliability, 44(9-11):1541-1546, 2004. [doi]
Abstract is missing.