Monte Carlo Investigation of Traveling Accumulation Layers in InP Heterojunction Bipolar Transistor Power Amplifiers

Jonathan P. Sculley, Brian Markman, Utku Soylu, Yihao Fang, Miguel E. Urteaga, Andy D. Carter, Mark J. W. Rodwell, Paul D. Yoder. Monte Carlo Investigation of Traveling Accumulation Layers in InP Heterojunction Bipolar Transistor Power Amplifiers. In 2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS), Nashville, TN, USA, November 3-6, 2019. pages 1-4, IEEE, 2019. [doi]

@inproceedings{SculleyMSFUCRY19,
  title = {Monte Carlo Investigation of Traveling Accumulation Layers in InP Heterojunction Bipolar Transistor Power Amplifiers},
  author = {Jonathan P. Sculley and Brian Markman and Utku Soylu and Yihao Fang and Miguel E. Urteaga and Andy D. Carter and Mark J. W. Rodwell and Paul D. Yoder},
  year = {2019},
  doi = {10.1109/BCICTS45179.2019.8972778},
  url = {https://doi.org/10.1109/BCICTS45179.2019.8972778},
  researchr = {https://researchr.org/publication/SculleyMSFUCRY19},
  cites = {0},
  citedby = {0},
  pages = {1-4},
  booktitle = {2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS), Nashville, TN, USA, November 3-6, 2019},
  publisher = {IEEE},
  isbn = {978-1-7281-0586-4},
}