Lahouari Sebaa, Norm Gardner, Robert Neidorff, Rich Valley. Self-test in a VCM driver chip. In 13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA. pages 66-73, IEEE Computer Society, 1995. [doi]
@inproceedings{SebaaGNV95,
title = {Self-test in a VCM driver chip},
author = {Lahouari Sebaa and Norm Gardner and Robert Neidorff and Rich Valley},
year = {1995},
url = {http://csdl.computer.org/comp/proceedings/vts/1995/7000/00/70000066abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/SebaaGNV95},
cites = {0},
citedby = {0},
pages = {66-73},
booktitle = {13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA},
publisher = {IEEE Computer Society},
}