Test and reliability challenges in automotive microelectronics

C. Sebeke, C. Jung, Klaus Harbich, S. Fuchs, J. Schwarz, Peter Göhner. Test and reliability challenges in automotive microelectronics. In Georges G. E. Gielen, editor, Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006. pages 547, European Design and Automation Association, Leuven, Belgium, 2006. [doi]

Abstract

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