K. Seena, Rajan Sundaravardhan. Application of nyaya inference method for feature selection and ranking in classification algorithms. In 2017 International Conference on Advances in Computing, Communications and Informatics, ICACCI 2017, Udupi (Near Mangalore), India, September 13-16, 2017. pages 1085-1091, IEEE, 2017. [doi]
Abstract is missing.