Jaume Segura. CMOS Testing at the End of the Roadmap: Challenges and Opportunities. In Matteo Sonza Reorda, Ondrej Novák, Bernd Straube, Hana Kubatova, Zdenek Kotásek, Pavel Kubalík, Raimund Ubar, Jiri Bucek, editors, Proceedings of the 9th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2006), Prague, Czech Republic, April 18-21, 2006. pages 2, IEEE Computer Society, 2006.
@inproceedings{Segura06,
title = {CMOS Testing at the End of the Roadmap: Challenges and Opportunities},
author = {Jaume Segura},
year = {2006},
tags = {testing},
researchr = {https://researchr.org/publication/Segura06},
cites = {0},
citedby = {0},
pages = {2},
booktitle = {Proceedings of the 9th IEEE Workshop on Design \& Diagnostics of Electronic Circuits \& Systems (DDECS 2006), Prague, Czech Republic, April 18-21, 2006},
editor = {Matteo Sonza Reorda and Ondrej Novák and Bernd Straube and Hana Kubatova and Zdenek Kotásek and Pavel Kubalík and Raimund Ubar and Jiri Bucek},
publisher = {IEEE Computer Society},
isbn = {1-4244-0185-2},
}