Jaume Segura, Peter C. Maxwell. Guest Editors Introduction: Defect-Oriented Testing in the Deep-Submicron Era. IEEE Design & Test of Computers, 19(5):5-7, 2002. [doi]
@article{SeguraM02,
title = {Guest Editors Introduction: Defect-Oriented Testing in the Deep-Submicron Era},
author = {Jaume Segura and Peter C. Maxwell},
year = {2002},
doi = {10.1109/MDT.2002.1033786},
url = {http://doi.ieeecomputersociety.org/10.1109/MDT.2002.1033786},
tags = {testing, C++},
researchr = {https://researchr.org/publication/SeguraM02},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {19},
number = {5},
pages = {5-7},
}