Directed Test Case Generation for x86 Instruction Decoding

Peter-Michael Seidel. Directed Test Case Generation for x86 Instruction Decoding. In 15th International Microprocessor Test and Verification Workshop, MTV 2014, Austin, TX, USA, December 15-16, 2014. pages 78-82, IEEE, 2014. [doi]

Authors

Peter-Michael Seidel

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