Challenges Associated with Realization of Lot Level Fab Out Forecast in a Giga Wafer Fabrication Plant

Georg Seidel, Ching Foong Lee, Aik Ying Tang, Soo Leen Low, Boon-Ping Gan, Wolfgang Scholl. Challenges Associated with Realization of Lot Level Fab Out Forecast in a Giga Wafer Fabrication Plant. In Winter Simulation Conference, WSC 2020, Orlando, FL, USA, December 14-18, 2020. pages 1777-1788, IEEE, 2020. [doi]

Abstract

Abstract is missing.