Norbert Seifert, Shah M. Jahinuzzaman, Jyothi Velamala, Nikunj Patel. Susceptibility of planar and 3D tri-gate technologies to muon-induced single event upsets. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 2, IEEE, 2015. [doi]
Abstract is missing.