Studying the Impact of Clones on Software Defects

Gehan M. K. Selim, Liliane Barbour, Weiyi Shang, Bram Adams, Ahmed E. Hassan, Ying Zou. Studying the Impact of Clones on Software Defects. In Giuliano Antoniol, Martin Pinzger, Elliot J. Chikofsky, editors, 17th Working Conference on Reverse Engineering, WCRE 2010, 13-16 October 2010, Beverly, MA, USA. pages 13-21, IEEE Computer Society, 2010. [doi]

Authors

Gehan M. K. Selim

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Liliane Barbour

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Weiyi Shang

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Bram Adams

Identified as Bram Adams

Ahmed E. Hassan

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Ying Zou

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