Studying the Impact of Clones on Software Defects

Gehan M. K. Selim, Liliane Barbour, Weiyi Shang, Bram Adams, Ahmed E. Hassan, Ying Zou. Studying the Impact of Clones on Software Defects. In Giuliano Antoniol, Martin Pinzger, Elliot J. Chikofsky, editors, 17th Working Conference on Reverse Engineering, WCRE 2010, 13-16 October 2010, Beverly, MA, USA. pages 13-21, IEEE Computer Society, 2010. [doi]

@inproceedings{SelimBSAHZ10,
  title = {Studying the Impact of Clones on Software Defects},
  author = {Gehan M. K. Selim and Liliane Barbour and Weiyi Shang and Bram Adams and Ahmed E. Hassan and Ying Zou},
  year = {2010},
  doi = {10.1109/WCRE.2010.11},
  url = {http://dx.doi.org/10.1109/WCRE.2010.11},
  researchr = {https://researchr.org/publication/SelimBSAHZ10},
  cites = {0},
  citedby = {0},
  pages = {13-21},
  booktitle = {17th Working Conference on Reverse Engineering, WCRE 2010, 13-16 October 2010, Beverly, MA, USA},
  editor = {Giuliano Antoniol and Martin Pinzger and Elliot J. Chikofsky},
  publisher = {IEEE Computer Society},
  isbn = {978-0-7695-4123-5},
}