Learning Localized Spatial Material Properties of Substrates in Ultra-Thin Packages Using Markov Chain Monte Carlo and Finite Element Analysis

Cheryl Selvanayagam, Pham Luu Trung Duong, Nagarajan Raghavan. Learning Localized Spatial Material Properties of Substrates in Ultra-Thin Packages Using Markov Chain Monte Carlo and Finite Element Analysis. IEEE Access, 8:50163-50170, 2020. [doi]

Abstract

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