S. Semnani, Murray J. J. Holt. Improving the Performance of Multilayer Perceptron through Empirical Maximum Likelihood (EML) Learning Rule. In Proceedings of IAPR Workshop on Machine Vision Applications, MVA 1990, November 28-30, 1990, Kokubunji, Tokyo, Japan. pages 109-112, 1990. [doi]
Abstract is missing.