Designing robustness to temperature in a feedforward loop circuit

Shaunak Sen, Jongmin Kim, Richard M. Murray. Designing robustness to temperature in a feedforward loop circuit. In 53rd IEEE Conference on Decision and Control, CDC 2014, Los Angeles, CA, USA, December 15-17, 2014. pages 4629-4634, IEEE, 2014. [doi]

Authors

Shaunak Sen

This author has not been identified. Look up 'Shaunak Sen' in Google

Jongmin Kim

This author has not been identified. Look up 'Jongmin Kim' in Google

Richard M. Murray

This author has not been identified. Look up 'Richard M. Murray' in Google