Towards Designing Reliable Universal QCA Logic in the Presence of Cell Deposition Defect - researchr publication authors

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Bibhash Sen, Rajdeep Kumar Nath, Rijoy Mukherjee, Yashraj Sahu, Biplab K. Sikdar. Towards Designing Reliable Universal QCA Logic in the Presence of Cell Deposition Defect. In 29th International Conference on VLSI Design and 15th International Conference on Embedded Systems, VLSID 2016, Kolkata, India, January 4-8, 2016. pages 575-576, IEEE Computer Society, 2016. [doi]

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