A simple Bayes analysis of Weibull Based Accelerated Test model

Rijji Sen, Rakesh Ranjan, Satyanshu K. Upadhyay. A simple Bayes analysis of Weibull Based Accelerated Test model. Int. J. Systems Assurance Engineering and Management, 8(1):505-511, 2017. [doi]

Authors

Rijji Sen

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Rakesh Ranjan

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Satyanshu K. Upadhyay

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