Rijji Sen, Rakesh Ranjan, Satyanshu K. Upadhyay. A simple Bayes analysis of Weibull Based Accelerated Test model. Int. J. Systems Assurance Engineering and Management, 8(1):505-511, 2017. [doi]
@article{SenRU17,
title = {A simple Bayes analysis of Weibull Based Accelerated Test model},
author = {Rijji Sen and Rakesh Ranjan and Satyanshu K. Upadhyay},
year = {2017},
doi = {10.1007/s13198-015-0389-8},
url = {http://dx.doi.org/10.1007/s13198-015-0389-8},
researchr = {https://researchr.org/publication/SenRU17},
cites = {0},
citedby = {0},
journal = {Int. J. Systems Assurance Engineering and Management},
volume = {8},
number = {1},
pages = {505-511},
}