Manidip Sengupta, Sharad Saxena, Lidia Daldoss, Glen Kramer, Sean Minehane, Jianjun Cheng. Application Specific Worst Case Corners Using Response Surfaces and Statistical Models. In 5th International Symposium on Quality of Electronic Design (ISQED 2004), 22-24 March 2004, San Jose, CA, USA. pages 351-356, IEEE Computer Society, 2004. [doi]
Abstract is missing.