Murat Sensoy, Maryam Saleki, Simon Julier, Reyhan Aydogan, John Reid. Misclassification Risk and Uncertainty Quantification in Deep Classifiers. In IEEE Winter Conference on Applications of Computer Vision, WACV 2021, Waikoloa, HI, USA, January 3-8, 2021. pages 2483-2491, IEEE, 2021. [doi]
Abstract is missing.