A Statistic-Based Scan Chain Reordering for Energy-Quality Scalable Scan Test

Sungyoul Seo, Keewon Cho, Young-Woo Lee, Sungho Kang. A Statistic-Based Scan Chain Reordering for Energy-Quality Scalable Scan Test. IEEE J. Emerg. Sel. Topics Circuits Syst., 8(3):391-403, 2018. [doi]

Abstract

Abstract is missing.