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Three-Dimensional Stacked Memory System for Defect Tolerance

Haejun Seo, Yoonseok Heo, Taewon Cho. Three-Dimensional Stacked Memory System for Defect Tolerance. In Tai-Hoon Kim, Young Hoon Lee, Wai-Chi Fang, editors, Future Generation Information Technology - 4th International Conference, FGIT 2012, Gangneug, Korea, December 16-19, 2012. Proceedings. Volume 7709 of Lecture Notes in Computer Science, pages 15-24, Springer, 2012. [doi]

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Haejun Seo

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Yoonseok Heo

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Taewon Cho

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