Haejun Seo, Yoonseok Heo, Taewon Cho. Three-Dimensional Stacked Memory System for Defect Tolerance. In Tai-Hoon Kim, Young Hoon Lee, Wai-Chi Fang, editors, Future Generation Information Technology - 4th International Conference, FGIT 2012, Gangneug, Korea, December 16-19, 2012. Proceedings. Volume 7709 of Lecture Notes in Computer Science, pages 15-24, Springer, 2012. [doi]
@inproceedings{SeoHC12,
title = {Three-Dimensional Stacked Memory System for Defect Tolerance},
author = {Haejun Seo and Yoonseok Heo and Taewon Cho},
year = {2012},
doi = {10.1007/978-3-642-35585-1_3},
url = {http://dx.doi.org/10.1007/978-3-642-35585-1_3},
researchr = {https://researchr.org/publication/SeoHC12},
cites = {0},
citedby = {0},
pages = {15-24},
booktitle = {Future Generation Information Technology - 4th International Conference, FGIT 2012, Gangneug, Korea, December 16-19, 2012. Proceedings},
editor = {Tai-Hoon Kim and Young Hoon Lee and Wai-Chi Fang},
volume = {7709},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-642-35584-4},
}