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Multi-level storage in a nano-floating gate MOS capacitor using a stepped control oxide

Jun-Hyuk Seo, Ji-Young Kim, Young-Bae Kim, Dong Wook Kim, Haeri Kim, Hyun Cho, Duck-Kyun Choi. Multi-level storage in a nano-floating gate MOS capacitor using a stepped control oxide. Microelectronics Reliability, 53(4):528-532, 2013. [doi]

Authors

Jun-Hyuk Seo

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Ji-Young Kim

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Young-Bae Kim

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Dong Wook Kim

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Haeri Kim

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Hyun Cho

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Duck-Kyun Choi

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