Jun-Hyuk Seo, Ji-Young Kim, Young-Bae Kim, Dong Wook Kim, Haeri Kim, Hyun Cho, Duck-Kyun Choi. Multi-level storage in a nano-floating gate MOS capacitor using a stepped control oxide. Microelectronics Reliability, 53(4):528-532, 2013. [doi]
@article{SeoKKKKCC13,
title = {Multi-level storage in a nano-floating gate MOS capacitor using a stepped control oxide},
author = {Jun-Hyuk Seo and Ji-Young Kim and Young-Bae Kim and Dong Wook Kim and Haeri Kim and Hyun Cho and Duck-Kyun Choi},
year = {2013},
doi = {10.1016/j.microrel.2012.12.008},
url = {http://dx.doi.org/10.1016/j.microrel.2012.12.008},
researchr = {https://researchr.org/publication/SeoKKKKCC13},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {53},
number = {4},
pages = {528-532},
}