Jung-Eun Seok, Hyun Joo Kim, Jae-Yong Seo, Sam-Jin Hwang, Byung-Heon Kwak. Optimization of gate poly TAB size and reliability on short channel pMOSFET. Microelectronics Reliability, 48(8-9):1185-1188, 2008. [doi]
@article{SeokKSHK08,
title = {Optimization of gate poly TAB size and reliability on short channel pMOSFET},
author = {Jung-Eun Seok and Hyun Joo Kim and Jae-Yong Seo and Sam-Jin Hwang and Byung-Heon Kwak},
year = {2008},
doi = {10.1016/j.microrel.2008.07.007},
url = {http://dx.doi.org/10.1016/j.microrel.2008.07.007},
tags = {optimization, reliability},
researchr = {https://researchr.org/publication/SeokKSHK08},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {48},
number = {8-9},
pages = {1185-1188},
}