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Jung-Eun Seok, Hyun Joo Kim, Jae-Yong Seo, Sam-Jin Hwang, Byung-Heon Kwak. Optimization of gate poly TAB size and reliability on short channel pMOSFET. Microelectronics Reliability, 48(8-9):1185-1188, 2008. [doi]
Abstract is missing.