Johanna Sepúlveda. T1B: Special session: Data analytics driven design for yield, manufacturability and reliability: Where machine learning meets design automation. In Massimo Alioto, Hai Helen Li, Jürgen Becker, Ulf Schlichtmann, Ramalingam Sridhar, editors, 30th IEEE International System-on-Chip Conference, SOCC 2017, Munich, Germany, September 5-8, 2017. pages 1, IEEE, 2017. [doi]
@inproceedings{Sepulveda17, title = {T1B: Special session: Data analytics driven design for yield, manufacturability and reliability: Where machine learning meets design automation}, author = {Johanna Sepúlveda}, year = {2017}, doi = {10.1109/SOCC.2017.8226045}, url = {https://doi.org/10.1109/SOCC.2017.8226045}, researchr = {https://researchr.org/publication/Sepulveda17}, cites = {0}, citedby = {0}, pages = {1}, booktitle = {30th IEEE International System-on-Chip Conference, SOCC 2017, Munich, Germany, September 5-8, 2017}, editor = {Massimo Alioto and Hai Helen Li and Jürgen Becker and Ulf Schlichtmann and Ramalingam Sridhar}, publisher = {IEEE}, isbn = {978-1-5386-4034-0}, }