Jyotsna Sequeira, Suriyaprakash Natarajan, Prashant Goteti, Nitin Chaudhary. Fault simulation for analog test coverage. In 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016. pages 1-7, IEEE, 2016. [doi]
Abstract is missing.